
InAs (100), un-doped 5x5x0.5mm, 1sp
- Growth method LEC
- Orientation (100) +/- 0.5º
- Orientation Flat N/A
- Doping Undoped
- Conductivity type N type
- Carrier Concentration <3E16 / cm3
- Mobility >20000 cm2/V.S
- EPD <5E4 / cm 2
- Standard thickness 500+/- 20 mm
- Standard size 5mm x 5mm
- Polish one-side polished
Related Product
| Other InAs |
InSb |
InP |
GaAs |
GaSb |
Wafer Box |
Film Coater |
RTP Furnaces |
InAs (100), un-doped 5x5x0.5mm, 1sp
- Growth method LEC
- Orientation (100) +/- 0.5º
- Orientation Flat N/A
- Doping Undoped
- Conductivity type N type
- Carrier Concentration <3E16 / cm3
- Mobility >20000 cm2/V.S
- EPD <5E4 / cm 2
- Standard thickness 500+/- 20 mm
- Standard size 5mm x 5mm
- Polish one-side polished
Related Product
| Other InAs |
InSb |
InP |
GaAs |
GaSb |
Wafer Box |
Film Coater |
RTP Furnaces |
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Description
- Growth method LEC
- Orientation (100) +/- 0.5º
- Orientation Flat N/A
- Doping Undoped
- Conductivity type N type
- Carrier Concentration <3E16 / cm3
- Mobility >20000 cm2/V.S
- EPD <5E4 / cm 2
- Standard thickness 500+/- 20 mm
- Standard size 5mm x 5mm
- Polish one-side polished
Related Product
| Other InAs |
InSb |
InP |
GaAs |
GaSb |
Wafer Box |
Film Coater |
RTP Furnaces |










