
Ge Wafer Undoped (100) 3" dia x 0.5 mm 1 side polished resistivity: >50 ohm-cm - GEUa76D05C1R50US
Ge Wafer Undoped (100) 3" dia x 0.5 mm 1 side polished resistivity: >50 ohm-cm - GEUa76D05C1R50US
Ge Wafer Specification
-
Growing Method: CZ
-
Orientation: (100) +/-0.5 Deg.
-
Wafer Size: 3" dia x 0.5 mm
-
Surface Polishing: one side optical polished
-
Surface finish (RMS or Ra) : < 30A
-
Doping: Undoped
-
Conductor type: N-type
-
Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)
Original: $769.00
-65%$769.00
$269.15Ge Wafer Undoped (100) 3" dia x 0.5 mm 1 side polished resistivity: >50 ohm-cm - GEUa76D05C1R50US
Ge Wafer Specification
-
Growing Method: CZ
-
Orientation: (100) +/-0.5 Deg.
-
Wafer Size: 3" dia x 0.5 mm
-
Surface Polishing: one side optical polished
-
Surface finish (RMS or Ra) : < 30A
-
Doping: Undoped
-
Conductor type: N-type
-
Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)
Product Information
Product Information
Shipping & Returns
Shipping & Returns
Description
Ge Wafer Specification
-
Growing Method: CZ
-
Orientation: (100) +/-0.5 Deg.
-
Wafer Size: 3" dia x 0.5 mm
-
Surface Polishing: one side optical polished
-
Surface finish (RMS or Ra) : < 30A
-
Doping: Undoped
-
Conductor type: N-type
-
Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)











