
Ge Wafer ,N-type Undoped (100) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm
Ge Wafer Specification
- Growing Method: CZ
- Orientation: (100) +/_0.5 Deg.
- Wafer Size: 3" dia x 0.5 mm
- Surface Polishing: two sides optical polished
- Surface finish (RMS or Ra) : < 30A
- Doping: Undoped
- Conductor type: N-type
- Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)
Original: $799.00
-65%$799.00
$279.65Ge Wafer ,N-type Undoped (100) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm
Ge Wafer Specification
- Growing Method: CZ
- Orientation: (100) +/_0.5 Deg.
- Wafer Size: 3" dia x 0.5 mm
- Surface Polishing: two sides optical polished
- Surface finish (RMS or Ra) : < 30A
- Doping: Undoped
- Conductor type: N-type
- Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)
Product Information
Product Information
Shipping & Returns
Shipping & Returns
Description
Ge Wafer Specification
- Growing Method: CZ
- Orientation: (100) +/_0.5 Deg.
- Wafer Size: 3" dia x 0.5 mm
- Surface Polishing: two sides optical polished
- Surface finish (RMS or Ra) : < 30A
- Doping: Undoped
- Conductor type: N-type
- Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)











