
Si wafer (100), 3 "dia x0.38 mm, 1sp, N type, As-doped, R:0.001-0.005 ohm.cm
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.38 mm
- Orientation: (100)
- Polish: One side polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
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Original: $49.95
-65%$49.95
$17.48Si wafer (100), 3 "dia x0.38 mm, 1sp, N type, As-doped, R:0.001-0.005 ohm.cm
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.38 mm
- Orientation: (100)
- Polish: One side polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
Other Crystal wafer A-Z |
Plasma Cleaner |
Wafer Containers |
Dicing saw |
Film Coater |
Product Information
Product Information
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Shipping & Returns
Description
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.38 mm
- Orientation: (100)
- Polish: One side polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
Other Crystal wafer A-Z |
Plasma Cleaner |
Wafer Containers |
Dicing saw |
Film Coater |










