
Si wafer (100), 3 "dia x0.35 mm, 2sp, N type, As-doped, R:0.001-0.005 ohm.cm
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.35 mm
- Orientation: (100)
- Polish: two sides polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
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Original: $59.95
-65%$59.95
$20.98Si wafer (100), 3 "dia x0.35 mm, 2sp, N type, As-doped, R:0.001-0.005 ohm.cm
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.35 mm
- Orientation: (100)
- Polish: two sides polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
Other Crystal wafer A-Z |
Plasma Cleaner |
Wafer Containers |
Dicing saw |
Film Coater |
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Product Information
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Description
- Single crystal Si
- Conductivity: N type ( As- doped)
- Resistivity: 0.001-0.005 ohm.cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.) - Size: 3" diameter x 0.35 mm
- Orientation: (100)
- Polish: two sides polished
- Surface roughness: < 5A
Optional: you may need tool below to handle the wafer ( click picture to order )
Other Crystal wafer A-Z |
Plasma Cleaner |
Wafer Containers |
Dicing saw |
Film Coater |










